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NIST Calibration Wafers
Using an MSP 2300G3 Particle D
Deposition System sets the standard for wafer inspection and metrology equipment.
Increases yield for leading-edge devices.
Certified Wafer and Reticle Contamination Standards available for calibrating and
monitoring inspection systems.
Reliable particle size standards for calibrating
surface scanning equipment or particle
counters.
MSP covers all your particle and calibration
needs with advanced technology.
Measured on a KLA-Tencor SP2
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