| Manufacturer | Model | Description |
|
|
Ultrapointe
|
1010
|
|
Teradyne
|
J973
|
Auto Test System
|
|
Teradyne
|
SPARC A540
|
Automatic Test System
|
|
|
SDI
|
FAaST 330-DP+USPV+SILC
|
|
Rudolph Technologies
|
Metapulse 300
|
Film Thickness Measurement System
|
|
Rigaku
|
Wafer X-300
|
X-Ray Fluorescence System
|
|
Rigaku
|
DPGS
|
X-Ray Cut Surface Inspection Machine
|
|
Rigaku
|
3700H TXRF
|
X-Ray Spectrometer
|
|
|
QC Optics
|
API-4000
|
|
Prometrix
|
FT-750
|
|
|
Prometrix
|
uv-1050
|
Thin Film
|
|
|
Plasma MOS
|
SD 2000
|
|
Philips
|
pw-2800
|
Fluorescent Inspection System
|
|
Olympus
|
BH
|
Microscope
|
|
Olympus
|
300702
|
Table Inspection Microscope
|
|
Nikon
|
6
|
Mask Comparator
|
|
|
Nicolet
|
205 Spectrometer FT-IR
|
|
|
Nicolet
|
ECO-8S FT-IR Spectrometer(s)
|
|
Nanometrics
|
Nanoline 50-2c
|
CD Measurement System
|
|
Nanometrics
|
9000i
|
Integrated Film Analysis System(s)
|
|
Nanometrics
|
8300XSE
|
Film Thickness Analyzer(s) with Spectroscopic Ellipsometry
|
|
Nanometrics
|
AFT/2100
|
UV Film Thickness Measurement System
|
|
KLA
|
2132
|
Wafer Defect Inspection System (PARTS) 150mm
|
|
KLA
|
5011
|
Overlay Precision Measurement System
|
|
KLA
|
7700
|
Patterned Wafer Inspection System(s) 200mm
|